Measuring national technological trajectories using 200 years of international patent data

Bergeaud, Antonin; Gozen, Ruveyda Nur; Van Reenen, John

Measuring national technological trajectories using 200 years of international patent data

Antonin Bergeaud, Ruveyda Nur Gozen and John Van Reenen

Innovation underpins sustained long-run economic growth, yet measuring technological success is challenging. This column compiles two centuries of patent data and leverages filings in multiple patent offices to document the rise and decline of technological leadership. The findings suggest that technological progress can be fostered through long-run investments in R&D, education, and national security.

17 March 2026

Vox EU

https://cepr.org/voxeu/columns/measuring-national-technological-trajectories-using-200-years-international-patent

This Blog is published under the centre's Growth programme.

This publication comes under the following theme: Innovation drivers