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Staff Biography


[Photo: Dennis VERHOEVEN] Dr Dennis VERHOEVEN
Research Officer - Growth
Email: d.j.verhoeven@lse.ac.uk
Room/Desk: 32L 2.02 C  



Expertise: Economics of Innovation, Economics of Science, Quantitative Methods

Biography:

Dennis received his PhD at the Faculty of Business and Economics at KU Leuven in 2016. Prior to joining the CEP as a research officer, he worked as a post-doctoral fellow at KU Leuven and was a visiting scholar at Duke University. At LSE, he works with prof. Ralf Martin on the Horizon 2020 project ‘WATSON Innovation Analytics’. During his time as a PhD student and post-doc, he worked on the project ‘Radical Innovation’ (with prof. Reinhilde Veugelers) and the 'Chair for Belgian Business Champions’ (with prof. Luc Sels and prof. Bart Van Looy). He also co-developed the Massive Open On-line Course (MOOC) ‘Principles of Economics for Scientists’ in the light of the EU-funded IBIS project.

Current Areas of Research:

Broadly speaking, Dennis’ research interests lie in the area of economics of innovation and science. His dissertation focuses on measuring and analyzing technological novelty using patent-based indicators. Furthermore, it explores the relationship between the knowledge composition in teams and breakthrough innovation outcomes. More recent work focuses on the impact of knowledge disclosure and industry-science links on radically novel technological outcomes, as well as on spillovers by individual scientists.

Education:

  • PhD, Business Economics, KU Leuven
  • MSc, Business Engineering, KU Leuven

Awards:

  • VvE-prize 2016: Biannual prize awarded to a published contribution in economics and management by the Society for Economics (VvE).
  • Bent Dalum PhD Award for most promising research project at the 2015 DRUID Academy Conference
  • Post-Doctoral Mandate (PDM) Scholarship, 2016-2017

Affiliations/Professional activities with other institutions:

Selected Publications:

  • Verhoeven, D., Bakker, J., Veugelers, R. Measuring Technological Novelty with Patent Based Indicators. Research Policy, 45 (3) pp. 707-723

  • Bakker, J., Verhoeven, D., Van Looy B. Patent citation indicators: One size fits all? Scientometrics, 106 (1) pp. 187-211